Electrochemical studies of capacitance in cerium oxide thin films and its relationship to anionic and electronic defect densities
- 27 July 2009
- journal article
- research article
- Published by Royal Society of Chemistry (RSC) in Physical Chemistry Chemical Physics
- Vol. 11 (37), 8144-8148
- https://doi.org/10.1039/b910903j
Abstract
Small polaron carrier density in epitaxial, doped CeO2 thin films under low oxygen partial pressure was determined from electrochemically-measured capacitance after accounting for interfacial effects and shown to agree well with bulk values.Keywords
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