An Electrical Technique to Measure the Radiation Susceptibility of MOS Gate Insulators
- 1 January 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 26 (6), 4814-4818
- https://doi.org/10.1109/tns.1979.4330233
Abstract
No abstract availableKeywords
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