The measurement of self-focusing parameters using intrinsic optical damage
- 1 September 1973
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Quantum Electronics
- Vol. 9 (9), 954-956
- https://doi.org/10.1109/jqe.1973.1077770
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
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