Exit wave reconstructions using through focus series of HREM images

Abstract

The through focus exit wave reconstruction technique uses a series of high resolution electron microscopy images to reconstruct the complex electron wavefunction at the exit plane of the specimen. The feasibility of the through focus exit wave reconstruction method and its most important limitations are discussed. It is shown that—provided all aberrations of the microscope are well corrected for—a large improvement in the interpretability of the information can be obtained. Microsc. Res. Tech. 49:301–323, 2000.