factors of quartz oscillator modes as a probe of submonolayer-film dynamics
- 15 July 1986
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 34 (2), 1403-1404
- https://doi.org/10.1103/physrevb.34.1403
Abstract
That frequency shifts by quartz crystals oscillating in the transverse shear mode can be used to determine adsorption isotherms for monolayer and submonolayer adsorbed films is well understood. Here, the nature of the dynamical information contained in the quality factors of such modes is theoretically discussed.Keywords
This publication has 9 references indexed in Scilit:
- Single-crystal silicon high-Q torsional oscillatorsReview of Scientific Instruments, 1985
- Incomplete wetting ofHe4films on Ag and Au(111) surfacesPhysical Review B, 1985
- Triple-Point Wetting of Light Molecular Gases on Au(111) SurfacesPhysical Review Letters, 1984
- Melting in "Two-Dimensional" SolidHe3Physical Review Letters, 1979
- Study of the Superfluid Transition in Two-DimensionalFilmsPhysical Review Letters, 1978
- Superfluid Transition ofFilms Adsorbed on Porous Vycor GlassPhysical Review Letters, 1977
- Effects of Gas Pressure on Quartz-Crystal MicrobalancesPublished by Springer Nature ,1966
- Verwendung von Schwingquarzen zur W gung d nner Schichten und zur Mikrow gungThe European Physical Journal A, 1959
- Statistical-Mechanical Theory of Irreversible Processes. I. General Theory and Simple Applications to Magnetic and Conduction ProblemsJournal of the Physics Society Japan, 1957