Study of very thin surface layers by means of depth selective conversion electron Mössbauer spectroscopy (DCEMS)
- 1 February 1982
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 192 (2-3), 539-543
- https://doi.org/10.1016/0029-554x(82)90870-9
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Analysis of the electron transport in conversion electron Mössbauer spectroscopy (CEMS)Nuclear Instruments and Methods, 1978
- An electrostatic spectrometer for conversion electron Mössbauer spectroscopyNuclear Instruments and Methods, 1978
- Spectroscopie Mössbauer de 57Fe et 119Sn par détection des électrons de conversion et auger application à des études de surfaceRevue de Physique Appliquée, 1975
- Method of analysis of thin surface layers by the Mössbauer effectNuclear Instruments and Methods, 1969