A new approach to measure ion reflection and secondary ion emission during ion bombardment of atomically clean and smooth monocrystalline metal surfaces
- 30 April 1970
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 20 (2), 424-428
- https://doi.org/10.1016/0039-6028(70)90194-9
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Ion reflection from a single crystalCanadian Journal of Physics, 1968
- SECONDARY ION EMISSIONSoviet Physics Uspekhi, 1967
- Generation of clean surfaces in high vacuumBritish Journal of Applied Physics, 1963