Comparison of Si(100) and Si(111) surfaces after moderate to high exposures of XeF2
- 2 August 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 173 (2-3), 455-464
- https://doi.org/10.1016/0039-6028(86)90202-5
Abstract
No abstract availableThis publication has 20 references indexed in Scilit:
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