Low frequency noise and DLTS as semiconductor device characterization tools
- 29 February 1988
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 31 (2), 205-217
- https://doi.org/10.1016/0038-1101(88)90129-3
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A study of grown-in impurities in silicon by deep-level transient spectroscopySolid-State Electronics, 1983
- Capacitance Transient SpectroscopyAnnual Review of Materials Science, 1977