Low-energy electron transmission method for measuring charge trapping in dielectric films
- 1 August 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (8), 2724-2732
- https://doi.org/10.1063/1.1140649
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Detection of Hot Electron-Induced Radiation Damage in Organic Dielectrics by Exoelectron Emission from Thin FilmsIEEE Transactions on Electrical Insulation, 1987
- Near-threshold electronic excitation by electron impact of multilayer physisorbedand COPhysical Review A, 1987
- The physics of electrical breakdown and prebreakdown in solid dielectricsPublished by Springer Nature ,1987
- Analysis of low-energy electron transmission experiments through thin solid xenon films in the elastic scattering regionPhysical Review B, 1985
- A review of methods for change- or field-distribution studies on radiation-charged dielectric filmsRadiation Physics and Chemistry (1977), 1984
- Structural-order effects in low-energy electron transmission spectra of condensed Ar, Kr, Xe,, CO, andPhysical Review B, 1984
- Elastic and inelastic mean-free-path determination in solid xenon from electron transmission experimentsPhysical Review B, 1982
- Transmission of 0–15 eV monoenergetic electrons through thin-film molecular solidsThe Journal of Chemical Physics, 1979
- Kinetics of electron trapping reactions in amorphous solids; a non-Gaussian diffusion modelPhysical Review B, 1977
- Characteristics of the Trochoidal Electron MonochromatorReview of Scientific Instruments, 1970