A ratio technique for micro-Auger analysis
- 31 January 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 62 (1), 277-292
- https://doi.org/10.1016/0039-6028(77)90443-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Scanning auger electron microscopy at 30 nm resolutionPhilosophical Magazine, 1976
- Auger electron spectroscopy at high spatial resolution and nA primary beam currentsJournal of Vacuum Science and Technology, 1975
- Auger Electron Spectroscopy in the Scanning Electron Microscope: Auger Electron ImagesApplied Physics Letters, 1971
- Marcus 4Published by Walter de Gruyter GmbH ,1970
- Estimates of the Efficiencies of Production and Detection of Electron-Excited Auger EmissionJournal of Applied Physics, 1969