Design criteria and sensitivity calculations for multielemental trace analysis at the NSLS x-ray microprobe
- 1 May 1985
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 10-11, 293-298
- https://doi.org/10.1016/0168-583x(85)90255-1
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
- Focusing optics for a synchrotron x-radiation microprobeNuclear Instruments and Methods in Physics Research, 1984
- The design of an X-ray microprobe at the SRS Daresbury (UK)Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Experimental comparison of synchrotron radiation with other modes of excitation of X rays for trace element analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Design considerations for an X-ray microprobeNuclear Instruments and Methods in Physics Research, 1983
- Synchrotron radiation x-ray fluorescence analysisAnalytical Chemistry, 1983
- Trace Element Measurements with Synchrotron RadiationIEEE Transactions on Nuclear Science, 1983
- Sensitivity calculations for multielemental trace analysis by synchrotron radiation induced X-ray fluorescenceNuclear Instruments and Methods in Physics Research, 1982
- Chemical microanalysis by x-ray microscopy near absorption edge with synchrotron radiationApplied Physics Letters, 1977
- A Scanning X-Ray Microscope Using Synchrotron RadiationScience, 1972