Temperature Dependence ofNoise in Silver and Copper
- 5 September 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 39 (10), 643-646
- https://doi.org/10.1103/physrevlett.39.643
Abstract
We report the first systematic measurements of the temperature dependence of excess noise in metals. The magnitude of the noise in thin films of both Cu and Ag shows a rapid increase with increasing temperature between 90 and 350 K. In Ag, the noise reaches a maximum at K, then decreases slowly. In Cu, the peak occurs at K. The strong observed temperature dependences is in sharp disagreement with the predictions of current models for the origin of the noise.
Keywords
This publication has 4 references indexed in Scilit:
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- Flicker () noise: Equilibrium temperature and resistance fluctuationsPhysical Review B, 1976
- Low-Frequency Noise in Tin Films at the Superconducting TransitionPhysical Review Letters, 1975
- 1/⨍ noise in continuous thin gold filmsPhysica, 1969