An ultrahigh vacuum scanning tunneling microscope for surface science studies
- 1 December 1990
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 61 (12), 3769-3774
- https://doi.org/10.1063/1.1141551
Abstract
We describe the construction and operation of a scanning tunneling microscope designed in our laboratory that fits standard ultrahigh vacuum (UHV) systems as an add‐on instrument. Sample motion is accomplished by electrical signals, eliminating mechanical feedthroughs. Samples are easily transferred to a modified Varian manipulator for heating and interfacing with other surface science techniques. In situ tip replacement and sample transfer in and out of the UHV system is also possible.Keywords
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