Hillock defects in InGaAs/InP multi-layers grown by MBE
- 1 December 1983
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 64 (3), 521-528
- https://doi.org/10.1016/0022-0248(83)90337-8
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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