DX centre and large lattice relaxation effects in AlGaAs:Te studied by X-ray diffraction
- 1 January 1991
- journal article
- Published by IOP Publishing in Semiconductor Science and Technology
- Vol. 6 (1), 59-62
- https://doi.org/10.1088/0268-1242/6/1/011
Abstract
No abstract availableKeywords
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