New Evidence for Defect Creation by High Optical Excitation in Glow Discharge Amorphous Silicon
- 1 July 1980
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 19 (7), L357
- https://doi.org/10.1143/jjap.19.l357
Abstract
New evidence for creation of dangling bonds by high optical excitation at low temperatures is presented through the time-resolved luminescence measurements and ESR measurements in glow discharge amorphous silicon.Keywords
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