The Measurement of Surface Recombination Velocity on Silicon
- 1 December 1958
- journal article
- Published by IOP Publishing in Proceedings of the Physical Society
- Vol. 72 (6), 1007-1012
- https://doi.org/10.1088/0370-1328/72/6/309
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Measurement of surface recombination velocity in silicon by steady-state photoconductanceJournal of Physics and Chemistry of Solids, 1958
- Spectral Distribution of PhotoconductivityPhysical Review B, 1956
- Intrinsic Optical Absorption in Single-Crystal Germanium and Silicon at 77°K and 300°KPhysical Review B, 1955
- Infrared Absorption of Silicon Near the Lattice EdgePhysical Review B, 1955
- Einfluß von Diffusionslänge und Oberflächenrekombination auf den Sperrschicht-Photoeffekt an GermaniumThe European Physical Journal A, 1955