Optical losses of sputtered Ta2O5 films
- 1 January 1987
- journal article
- Published by EDP Sciences in Journal de Physique
- Vol. 48 (7), 1155-1159
- https://doi.org/10.1051/jphys:019870048070115500
Abstract
Visible light scattering as well as absorption measurements have been made on sputtered Ta2O5 single layers with changing the optical thickness of the film. Comparison of the results experimentally observed with those obtained from theory allowed conclusions to be drawn with respect to the dominant origins of scattering and absorption lossesKeywords
This publication has 6 references indexed in Scilit:
- Localization of absorption losses in oxide single-layer filmsJournal de Physique, 1987
- Scattering reduction or enhancement by a dielectric single layerApplied Optics, 1986
- Scattering from multilayer thin films: theory and experimentJournal of the Optical Society of America, 1981
- Light scattering from multilayer optics: comparison of theory and experimentApplied Optics, 1980
- Scatter losses of broadband interference coatingsApplied Optics, 1979
- Infrared light scattering from surfaces covered with multiple dielectric overlayersApplied Optics, 1977