Noise-induced error rate as limiting factory for energy per operation in digital ICs
- 1 October 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 12 (5), 527-530
- https://doi.org/10.1109/jssc.1977.1050947
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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