Atomic-scale characterization of the CdS/CuInSe2 interface in thin-film solar cells
- 7 March 2011
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 98 (10), 103504
- https://doi.org/10.1063/1.3560308
Abstract
Elemental mixing at the interface of a thin-film solar cell was studied by means of atom probe tomography. A Cu-depleted and Cd-doped region ( in width) was detected at the surface, proving the existence of a buried p-n homojunction within the absorber layer. Furthermore, CdS was found to infiltrate open pores existing in during the chemical bath deposition. This could explain why chemical bath deposition of CdS leads to higher solar cell efficiencies compared to physical vapor deposition of CdS.
Keywords
This publication has 14 references indexed in Scilit:
- Interpretation of admittance, capacitance-voltage, and current-voltage signatures in Cu(In,Ga)Se2 thin film solar cellsJournal of Applied Physics, 2010
- Review of Atom Probe FIB-Based Specimen Preparation MethodsMicroscopy and Microanalysis, 2007
- In situ site-specific specimen preparation for atom probe tomographyUltramicroscopy, 2006
- Solar photovoltaics R&D at the tipping point: A 2005 technology overviewJournal of Electron Spectroscopy and Related Phenomena, 2006
- Structural and chemical investigations of CBD- and PVD-CdS buffer layers and interfaces in Cu(In,Ga)Se2-based thin film solar cellsThin Solid Films, 2005
- Thin Film Deposition Methods for CuInSe2Solar CellsCritical Reviews in Solid State and Materials Sciences, 2005
- Direct evidence of a buried homojunction in Cu(In,Ga)Se2 solar cellsApplied Physics Letters, 2003
- Copper Indium Selenides and Related Materials for Photovoltaic DevicesCritical Reviews in Solid State and Materials Sciences, 2002
- Characterisation and modelling of chalcopyrite solar cellsThin Solid Films, 2001
- Observation of intermixing at the buried CdS/Cu(In, Ga)Se2 thin film solar cell heterojunctionApplied Physics Letters, 1999