Dielectric function of monocrystalline MoSi2by spectroscopic ellipsometry

Abstract

The dielectric function of monocrystalline Mo${\mathrm{Si}}_2$ has been investigated by spectroscopic ellipsometry in the (1-4.5)-eV range. The energy resolution of spectroscopic ellipsometry has been used for analyzing the mixing of metal $d$ electrons and the silicon $p$ electrons in the bulk monocrystalline disilicide, thus eliminating the contribution of intermediate phases. The dielectric tensor of Mo${\mathrm{Si}}_2$ is seen to have the same tetragonal symmetry as the crystalline structure. Ellipsometric results are compared with published photo-emission spectra.