Accurate cold-test model of helical TWT slow-wave circuits
- 1 April 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 45 (4), 966-971
- https://doi.org/10.1109/16.662812
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Measurement of Circuit Impedance of Periodically Loaded Structures by Frequency PerturbationProceedings of the IRE, 1954