A non-destructive study of the microscopic structure of porous Si
- 31 December 1993
- journal article
- Published by Elsevier in Journal of Luminescence
- Vol. 57 (1-6), 5-8
- https://doi.org/10.1016/0022-2313(93)90096-6
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The influence of nanocrystals on the dielectric function of porous siliconApplied Surface Science, 1993
- A detailed Raman study of porous siliconThin Solid Films, 1992