Surface profile reconstruction using near-field data
- 1 April 1995
- journal article
- Published by Elsevier in Optics Communications
- Vol. 116 (1-3), 20-24
- https://doi.org/10.1016/0030-4018(95)00033-5
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- Scattering of s-polarized electromagnetic waves by a 2d obstacle near an interfaceOptics Communications, 1989
- Scanning tunneling optical microscopyOptics Communications, 1989
- New form of scanning optical microscopyPhysical Review B, 1989
- Scattering of electromagnetic waves by rough dielectric surfacesPhysical Review B, 1988