Use of the electron microscope to measure the remanent magnetization of high coercivity thin films

Abstract

Describes how the electron microscope, operating as a low angle diffraction camera, has been used to measure the remanent magnetization of hard magnetic films up to 6.4*10⁴ A m^-1 (800 Oe) coercivity. Experimental details are described and a full discussion of errors is given. Besides having good accuracy, the method can be used for the measurement of anhysteretic magnetization parameters.