Internal conversion electron measurement by a Si surface barrier detector
- 1 January 1969
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 67 (1), 38-44
- https://doi.org/10.1016/0029-554x(69)90538-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Accurate determination of the ionization energy in semiconductor detectorsNuclear Instruments and Methods, 1968
- Silicon Surface Barrier Detectors with High Reverse Breakdown VoltagesIRE Transactions on Nuclear Science, 1962
- Encapsulated Surface Barrier Particle Detectors Some Methods and TechniquesIRE Transactions on Nuclear Science, 1962
- Silicon Surface-Barrier Nuclear Particle SpectrometerIRE Transactions on Nuclear Science, 1960