Servopositioning with picometer resolution
- 1 January 1993
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 64 (1), 168-173
- https://doi.org/10.1063/1.1144420
Abstract
A macroscopic one‐axis movement with picometer resolution was made possible by a feedback loop driving a piezoelectric element locking an elastic guide to a reference value, or to a reference path. The guide displacement has been measured by a high‐resolution optical interferometer. Not only were prompt and accurate positionings obtained, but disturbances due to seismic noise were also compensated for. In contrast to conventional positioning, driver linearity and stability, antivibration support, and maximum displacement are not subjected to strict conditions. The performances of an x‐ray interferometer were greatly improved by this feedback: the positioning with 1‐pm resolution over 30‐Hz bandwidth and 0.1‐mm maximum displacement was made possible.Keywords
This publication has 18 references indexed in Scilit:
- Subnanometer behavior of a capacitive feedback, piezoelectric displacement actuatorReview of Scientific Instruments, 1992
- A spring-guided micropositioner with linearized subnanometer resolutionReview of Scientific Instruments, 1991
- Phase Modulation in High-resolution Optical InterferometryMetrologia, 1991
- Nanometer positioning and its micro-dynamicsNanotechnology, 1990
- Progress at IMGC in the absolute determination of the silicon dIEEE Transactions on Instrumentation and Measurement, 1989
- Non-Linear Analysis of the Elastic Behaviour of a Translation Device for X-Ray InterferometryMetrologia, 1989
- A Simple Way to Reduce Hysteresis and Creep When Using Piezoelectric ActuatorsJapanese Journal of Applied Physics, 1988
- Translation stage for a scanning x-ray optical interferometerReview of Scientific Instruments, 1987
- The application of capacitance micrometry to the control of Fabry-Perot etalonsJournal of Physics E: Scientific Instruments, 1984
- Preliminary results in X-ray interferometry at the istituto di metrologia « G. Colonnetti »Lettere al Nuovo Cimento (1971-1985), 1978