Surface layers on cadmium telluride
- 1 April 1978
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 11 (5), L83-L86
- https://doi.org/10.1088/0022-3727/11/5/003
Abstract
A study of the surface layers formed on CdTe single crystals, following immersion in a range of etchants, has been carried out using X-ray photoelectron spectroscopy. Most etchants lead to a layer of tellurium oxide on the surface and severely deplete the surface region of cadmium. The best procedures for obtaining stoichiometric surfaces are outlined.Keywords
This publication has 4 references indexed in Scilit:
- X-ray photoemission studies of tellurium and some of its compoundsThe Journal of Chemical Physics, 1977
- The physical properties of cadmium tellurideRevue de Physique Appliquée, 1977
- Contribution to the determination of deep trapping levels in high resistivity films of n-type CdTeRevue de Physique Appliquée, 1977
- Raman detection of tellurium layers on surfaces of CdTeSurface Science, 1971