Computer modelling study of ablative optical recording
- 15 June 1980
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 36 (12), 950-952
- https://doi.org/10.1063/1.91661
Abstract
Computer modelling is used to study both the optical and thermal behavior of ablative optical storage media which consist of antireflection structures incorporating a thin active layer. Confirmation is given of Blom’s contention that the advantages of improved optical efficiency gained by use of antireflection structures can be lost by heat losses to the mirror layer underlying the active layer. However, this efficiency can be regained if the dielectric spacer between these two layers is made thick enough or has sufficiently low thermal conductivity.Keywords
This publication has 4 references indexed in Scilit:
- Heat capacities of linear high polymersPublished by Springer Nature ,2006
- Single Te films and Te trilayers for optical recordingApplied Physics Letters, 1979
- Antireflection structures for optical recordingIEEE Journal of Quantum Electronics, 1978
- Laser heating and melting of thin films on low-conductivity substratesJournal of Applied Physics, 1975