Computer Generation and Identification of Kikuchi Projections
- 1 April 1972
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 43 (4), 1408-1417
- https://doi.org/10.1063/1.1661333
Abstract
Computer programs were developed to provide for computer plotting of standard stereographic Kikuchi projections of any desired orientation and projection sphere radius for fcc (Al), bcc (Fe), diamond cubic (Si), and hcp (α‐Ti) crystals. The programs also provide for automatic identification of Kikuchi poles as well as identification of individual Kikuchi lines. Indexing of observed patterns becomes a matter of comparison between the experimental patterns and the projections. Coates projections for scanning electron microscopy and transmission Kossel or pseudo‐Kossel projections for x‐ray diffraction studies can also be generated simply by changing the input wavelengths. The matrix algebra employed in producing the projections is presented, and the details of the computer programs are described.Keywords
This publication has 15 references indexed in Scilit:
- High-voltage transmission scanning electron microscopyJournal of Applied Crystallography, 1970
- Electron Channelling Patterns from Small (10 µm) Selected Areas in the Scanning Electron MicroscopeNature, 1970
- Crystal Orientation and Lattice Parameters from Kossel LinesJournal of Applied Physics, 1968
- Kikuchi-like reflection patterns obtained with the scanning electron microscopePhilosophical Magazine, 1967
- The Determination of the Orientation of Micro‐Crystals Using a Back‐Reflection Kossel Technique and an Electron Probe MicroanalyserPhysica Status Solidi (b), 1967
- Determination of Lattice Parameters by the Kossel and Divergent X-Ray Beam TechniquesAdvances in X-ray Analysis, 1967
- Evaluation of Kossel Microdiffraction Procedures: The Cubic CaseJournal of Applied Physics, 1965
- Lattice Defect Research by Kossel Technique and Deformation AnalysisAdvances in X-ray Analysis, 1965
- Applications of Kikuchi Line Analyses in Electron MicroscopyJournal of Applied Physics, 1964
- Strain and Precision Lattice Parameter Measurements by the X-Ray Divergent Beam Method. IJournal of Applied Physics, 1964