Observations of Defects in Silicon Single Crystals
- 1 October 1966
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 5 (10), 979-980
- https://doi.org/10.1143/jjap.5.979
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- X-Ray Observations of Defect Structures in Silicon CrystalsJapanese Journal of Applied Physics, 1965
- Loop Shaped Images Observed in X-Ray Diffraction Micrographs of Silicon Single CrystalsJournal of the Physics Society Japan, 1962