Measurement of local variations in spacing and orientation of lattice plane of synthetic quartz
- 1 May 1979
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 46 (5), 691-700
- https://doi.org/10.1016/0022-0248(79)90187-8
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Impurity content of synthetic quartz single crystalsJournal of Crystal Growth, 1976
- Studies on growth defects in synthetic quartz by x-ray topographyJournal of Crystal Growth, 1976
- Measurements on Local Variations in Spacing and Orientation of the Lattice Plane of Silicon Single Crystals by X-Ray Double-Crystal TopographyJapanese Journal of Applied Physics, 1966
- Impurity content of synthetic quartz and its effect upon mechanical QJournal of Physics and Chemistry of Solids, 1965
- Substitutional and interstitial aluminum impurity in quartz, structure and color center interrelationships∗Journal of Physics and Chemistry of Solids, 1960