INTERPRETATION OF LOW-VOLTAGE PHOTOMEASUREMENTS IN METAL-INSULATOR-METAL FILMS
- 15 October 1966
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 9 (8), 317-319
- https://doi.org/10.1063/1.1754766
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Photovoltage Measurements on an Al-Al2O3-Al Thin-Film SandwichJournal of Applied Physics, 1966
- Potential Barrier Parameters in Thin-Film Al–Al2O3-Metal DiodesJournal of Applied Physics, 1966
- Hot-Electron Attenuation in ThinFilmsPhysical Review Letters, 1965
- Photo-effects in thin oxide film sandwich structuresSolid-State Electronics, 1965
- Photocurrents Through Thin Films of Al2O3Journal of Applied Physics, 1965
- Photoemissive Determination of Barrier Shape in Tunnel JunctionsPhysical Review Letters, 1965
- Thin oxide film sandwich structure photocellProceedings of the IEEE, 1963
- Attenuation Length Measurements of Hot Electrons in Metal FilmsPhysical Review B, 1962