Picosecond optical time-of-flight studies of carrier transport ina-Si:H–a-:H multilayers
- 7 September 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 59 (10), 1144-1147
- https://doi.org/10.1103/physrevlett.59.1144
Abstract
We report time-of-flight experiments in the time range from 0.2 psec to 1.8 nsec in a-Si:H–a-:H multilayer structures using a purely optical technique. The transport mechanism of photoexcited carriers is shown to be dispersive and its characteristic parameters are determined in the temperature range 70–300 K.
Keywords
This publication has 16 references indexed in Scilit:
- Initial Stages of Trapping in-Si:H Observed by Femtosecond SpectroscopyPhysical Review Letters, 1986
- Electroabsorption measurements of interfaces in a-Si:H/a-:H and a-Si:H/a-:H multilayer filmsPhysical Review B, 1986
- Influence of interference on photoinduced changes in transmission and reflectionOptics Communications, 1986
- Infrared spectroscopy of interfaces in amorphous hydrogenated silicon/silicon nitride superlatticesApplied Physics Letters, 1986
- Picosecond transient photocurrents in amorphous siliconPhysical Review B, 1981
- Generation of optical pulses shorter than 0.1 psec by colliding pulse mode lockingApplied Physics Letters, 1981
- Picosecond nonequilibrium carrier transport in GaAsApplied Physics Letters, 1981
- A physical interpretation of dispersive transport in disordered semiconductorsSolid State Communications, 1981
- Dispersive (non-Gaussian) transient transport in disordered solidsAdvances in Physics, 1978
- Anomalous transit-time dispersion in amorphous solidsPhysical Review B, 1975