Erbium in Si: Estimation of energy transfer rate and trap depth from temperature dependence of intra-4f-shell luminescence
- 1 March 1998
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 83 (5), 2800-2805
- https://doi.org/10.1063/1.367038
Abstract
No abstract availableKeywords
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