Measurement of damage distributions in ion bombarded Si, GaP and GaAs at 50 K
- 1 June 1976
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 135 (3), 489-495
- https://doi.org/10.1016/0029-554x(76)90063-x
Abstract
No abstract availableKeywords
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