Scanning x-ray radiography: First tests in an electron spectrometer
- 1 April 1982
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 53 (4), 3299-3302
- https://doi.org/10.1063/1.330985
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Electron spectroscopy for bulk and surface microscopy and microanalysisMaterials Science and Engineering, 1980
- Microanalyse par radiographie X à balayage et fluorescence X : une conception nouvelleJournal de Physique Lettres, 1979
- Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eVJournal of Electron Spectroscopy and Related Phenomena, 1976
- A Scanning X-Ray Microscope Using Synchrotron RadiationScience, 1972
- The Scanning X-Ray MicroscopeJournal of the Optical Society of America, 1953