Wet-chemical preparation and spectroscopic characterization of Si interfaces
- 1 August 2004
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 235 (3), 322-339
- https://doi.org/10.1016/j.apsusc.2004.05.105
Abstract
No abstract availableThis publication has 60 references indexed in Scilit:
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