Crater formation in Langmuir–Blodgett films induced by electronic sputtering with fast heavy ions
- 26 October 1987
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 51 (17), 1379-1381
- https://doi.org/10.1063/1.98684
Abstract
Secondary ion formation by fast heavy ion impact (electronic sputtering) on Langmuir–Blodgett films of fatty acids has been studied. The results show unambiguously that molecular ions originate from molecules in layers other than the surface layer. Furthermore, the results indicate that craters may be formed in electronic sputtering of such films. The depth of the craters depends on the stopping power of the incident ion and lower limits of the order of 100–200 Å are obtained from the ion data.Keywords
This publication has 13 references indexed in Scilit:
- Fast-ion-induced erosion of leucine as a function of the electronic stopping powerPhysical Review B, 1987
- Ion-track model for fast-ion-induced desorption of moleculesPhysical Review B, 1985
- Molecular Weight Determinations of Proteins by Californium Plasma Desorption Mass SpectrometryScience, 1984
- Molecular size effects in fast heavy ion induced desorption of biomoleculesRadiation Effects, 1984
- The irradiation of tungsten with metallic diatomic molecular ions: atomic resolution observations of depleted zonesNuclear Instruments and Methods in Physics Research, 1983
- Sputtering of insulators due to electronic excitation, by fast ions and electronsNuclear Instruments and Methods in Physics Research, 1983
- Electronic mechanisms for sputtering of condensed-gas solids by energetic ionsNuclear Instruments and Methods in Physics Research, 1982
- The velocity dependence of fast heavy-ion induced desorption of biomoleculesRadiation Effects and Defects in Solids, 1982
- Direct observation of spike effects in heavy-ion sputteringPhilosophical Magazine A, 1981
- New approach to the mass spectroscopy of non-volatile compoundsBiochemical and Biophysical Research Communications, 1974