Interference-Enhanced Raman Scattering of Very Thin Titanium and Titanium Oxide Films
- 28 January 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 44 (4), 273-276
- https://doi.org/10.1103/physrevlett.44.273
Abstract
The Raman spectra of very thin evaporated films (∼6 nm thick) of metallic titanium and oxidized titanium are obtained with a new technique called interference-enhanced Raman scattering. The results indicate that titanium films exhibit a crystalline hcp structure while the titanium oxide has an amorphous structure with local atomic bonding configurations similar to those in crystalline .
Keywords
This publication has 8 references indexed in Scilit:
- High-performance Te trilayer for optical recordingApplied Physics Letters, 1979
- Lattice dynamics of hcp TiPhysical Review B, 1979
- Thermally induced effects in evaporated chalcogenide films. I. StructurePhysical Review B, 1978
- ir reflectance spectra of : Infrared-active phonons and Ti electronic effectsPhysical Review B, 1977
- Optical constants of transition metals: Ti, V, Cr, Mn, Fe, Co, Ni, and PdPhysical Review B, 1974
- Raman scattering in -alloysPhysical Review B, 1974
- Raman Spectra of Ti, Mg, Zn, Fe, and MnPhysical Review B, 1967
- Optical Properties and Oxidation of Evaporated Titanium Films*Journal of the Optical Society of America, 1957