Evidence of SiO at the Si-oxide interface by surface soft X-ray absorption near edge spectroscopy
- 1 September 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 99 (1), 76-86
- https://doi.org/10.1016/0039-6028(80)90578-6
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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