Multiple-point depth profiling of multilayer Cr/Ni thin film structures on a rough substrate using scanning auger microscopy
- 1 September 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 131 (1-2), 149-154
- https://doi.org/10.1016/0040-6090(85)90384-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Influence of ion bombardment on depth resolution in Auger electron spectroscopy analysis of thin gold films on nickelThin Solid Films, 1976