The transverse Kerr effect in cobalt thin films and its application to a simple hysteresis loop plotter

Abstract
The transverse Kerr effect in thin films of cobalt has been measured as a function of the angle of incidence and the wavelength of the incident radiation. The significance of the results in the design of a simple hysteresis loop plotter is considered and conditions for maximum output signal are defined for a system using a tungsten source and a phototransistor detector.