Fabrication of a GaAs quantum-well-wire structure by Ga focused-ion-beam implantation and its optical properties
- 15 February 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (5), 2774-2777
- https://doi.org/10.1103/physrevb.37.2774
Abstract
A quantum-well wire was fabricated with use of local intermixing of a GaAs- As single-quantum-well epitaxial layer induced by Ga focused-ion-beam implantation. Fine structures were observed in low temperature photoluminescence and photoluminescence excitation spectra. These fine structures are explained by the density of states specific to the two-dimensionally confined carrier system.
Keywords
This publication has 14 references indexed in Scilit:
- Optically detected carrier confinement to one and zero dimension in GaAs quantum well wires and boxesApplied Physics Letters, 1986
- Defects in Ga+ Jon Implanted GaAs–AlAs MQW StructuresJapanese Journal of Applied Physics, 1986
- Quasi One-Dimensional Conduction in Multiple, Parallel Inversion LinesPhysical Review Letters, 1986
- Spatial quantization in GaAs–AlGaAs multiple quantum dotsJournal of Vacuum Science & Technology B, 1986
- Compositional Disordering of GaAs-AlxGa1-xAs Superlattice by Ga Focused Ion Beam Implantation and its Application to Submicron Structure FabricationJapanese Journal of Applied Physics, 1985
- Interband optical absorption in thin semiconducting quantum well wiresJournal of Vacuum Science & Technology A, 1985
- The transition from two- to one-dimensional electronic transport in narrow silicon accumulation layersJournal of Physics C: Solid State Physics, 1982
- Toward quantum well wires: Fabrication and optical propertiesApplied Physics Letters, 1982
- One-Dimensional Localization and Interaction Effects in Narrow (0.1-μm) Silicon Inversion LayersPhysical Review Letters, 1982
- Conductance in Restricted-Dimensionality Accumulation LayersPhysical Review Letters, 1982