Effect of helical slow-wave circuit variations on TWT cold-test characteristics
- 1 April 1998
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 45 (4), 972-976
- https://doi.org/10.1109/16.662813
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Accurate cold-test model of helical TWT slow-wave circuitsIEEE Transactions on Electron Devices, 1998
- Three-dimensional simulation of helix traveling-wave tube cold-test characteristics using MAFIAIEEE Transactions on Electron Devices, 1996