Auger spectra and LEED patterns from nickel deposits on cleaved silicon
- 31 July 1971
- journal article
- other
- Published by Elsevier in Surface Science
- Vol. 26 (2), 683-687
- https://doi.org/10.1016/0039-6028(71)90027-6
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Auger spectra and LEED patterns from vacuum cleaved silicon crystals with calibrated deposits of ironSurface Science, 1971
- SILICON (111)−7 STRUCTURE OBTAINED BY CLEAVAGE AT ROOM TEMPERATUREApplied Physics Letters, 1970
- Inelastic effects in Auger electron spectroscopySurface Science, 1970
- Auger electron spectroscopy of nickel deposits on the silicon (111) surfaceSurface Science, 1970
- The Diffusion of Iron and Nickel to Silicon SurfacesPhysica Status Solidi (b), 1970
- Auger spectroscopy of siliconSurface Science, 1969
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- SILICON (111) 7×7 STRUCTUREApplied Physics Letters, 1969
- On the nature of annealed semiconductor surfacesPhysics Letters A, 1968
- Auger Electron Spectroscopy of fcc Metal SurfacesJournal of Applied Physics, 1968