Scattering and spectral shape in ballistic-electron-emission microscopy ofNiSi2-Si(111) and Au-Si samples
- 15 September 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 46 (11), 7256-7259
- https://doi.org/10.1103/physrevb.46.7256
Abstract
The ballistic-electron-emission microscopy (BEEM) tip voltage versus collector current spectral shape is used as a tool to study Au-Si and -Si samples on a nanometer scale. A method is outlined for the extraction of an energy-dependent transmission factor from the BEEM spectra. Results for Au-Si samples compare favorably with theoretical interface transmission calculations. Data from both systems suggest that the shape of the spectra is influenced by scattering. The influence of scattering induced broadening of the injected electron transverse momentum distribution is considered.
Keywords
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