Effect of annealing temperature on physical and electrical properties of Bi3.25La0.75Ti3O12 thin films on Al2O3-buffered Si
- 18 March 2002
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 80 (11), 1984-1986
- https://doi.org/10.1063/1.1459115
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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