Ellipsometric study of adsorption complexes on silicon
- 31 August 1971
- journal article
- Published by Elsevier in Surface Science
- Vol. 27 (1), 107-116
- https://doi.org/10.1016/0039-6028(71)90164-6
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
- Ellipsometry and the clean surfaces of silicon and germaniumSurface Science, 1971
- AUGER ELECTRON SPECTROSCOPY MADE QUANTITATIVE BY ELLIPSOMETRIC CALIBRATIONApplied Physics Letters, 1971
- Plane specificity in the reaction of methanol and ethanol vapor with clean germaniumThe Journal of Physical Chemistry, 1969
- Ellipsometry in the sub-monolayer regionSurface Science, 1969
- Ellipsometric investigation of physisorption at low temperaturesSurface Science, 1969
- Adsorption of Gases in Multimolecular LayersJournal of the American Chemical Society, 1938